10. coating of the wafers with photoresist
11 Exposure of the photoresist with the DIMPLES mask 12. Developing the exposed photoresist to create the desired etch mask for subsequent pattern
13. the 1st oxide layer is then etched in an RIE system to form dimples
14. After etch, the photoresist is chemically stripped in a solvent bath.
The depth of the dimples is 750 nm
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15.-19 The wafers are then patterned with the third mask layer, ANCHOR1, and reactive ion etched. This step provides anchor holes that will be filled by the Poly 1 layer.
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20. the first structural layer of polysilicon (Poly 1) is deposited at a thickness of 2.0 ¦Ìm.
21. A thin (200 nm) layer of PSG is deposited over the polysilicon
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22. the wafer is annealed at 1050¡ãC for 1 hour£¬
The anneal dopes the polysilicon with phosphorus from the PSG layers both above and below it.
The anneal also serves to significantly reduce the net stress in the Poly 1 layer.
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23£27 The polysilicon (and its PSG masking layer) is lithographically patterned using a mask designed to form the first structural layer POLY1.£¨Í¿½º£¹â¿Ì£ÏÔÓ°£RIE¿ÌÊ´£
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29. The second PSG layer (Second Oxide) is deposited£¨0.75¦Ìm£©
30£34 The POLY1_POLY2_VIA level provides for etch holes in the Second Oxide down to the Poly 1 layer. This provide a mechanical and electrical connection between the Poly 1 and Poly 2 layers.£¨²¿·ÖÇå³ýµÚ¶þ²ãÑõ»¯¹èÒÔʹ¼´½«³Á»ýµÄµÚ¶þ²ã¹è
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40. The second structural layer, Poly 2, is then deposited (1.5 ¦Ìm thick)
41. the deposition of 200 nm PSG. On the top of POLY2