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SI2 -15 15 $ sampling range Ymin to Ymax(Y方向抽样范围)

SP2 0 1 $ weighting for y sampling: here constant(Y抽样权重,此为常量)

线源(圆柱体的极限)

c --- line source (degenerate cylindrical volumetric source)(线源,圆柱体源的极限情况)

SDEF pos=0 0 0 axs=1 0 0 ext=d1 rad=0 par=2 erg=1.25(位置,线向量,长度,半径,能量) SI1 0 1 $ axial sampling range: -X to X(轴向抽样范围)

SP1 -21 0 $ weighting for axial sampling: here constan(轴向抽样权重,此为常量)

3.3.4单向平行源

单向面源

c --- Disk source perpendicular to z-axis uniformly emitting 1.2-MeV neutrons monodirectionally in the +ve c z-direction.(面源Z轴方向垂线发射1.2MeV中子在。。。)

SDEF POS=0 0 0 AXS=0 0 1 EXT=0 RAD=d1 PAR=1 ERG=1.2 VEC=0 0 1 DIR=1

(位置 面向量 z方向厚度 半径 粒子类型 能量 。。。。 。。。。 ) SI1 0 15 $ radial sampling range: 0 to Rmax (=15cm)(径向抽样范围) SP1 -21 1 $ radial sampling weighting: r^1 for disk(径向抽样权重:r^2)

点源平行于圆锥体指向

c --- Point isotropic 1.5-MeV photon source collimated into an upward cone. Particles are confined to an c upward (+z axis) cone whose half-angle is acos(0.9) = 25.8 degrees about the z-axis. Angles are with c respect to the vector specified by VEC

c 各向同性的点源,发射1.5MeV光子能量,平行与一个向上的圆锥体。粒子被局限于向上(Z轴正方向)圆锥体内,次圆锥体的半角为对Z轴的acos(0.9)=25.8度,角度参照由VEC指定的向量。

SDEF POS=0 0 0 ERG=1.25 PAR=2 VEC=0 0 1 DIR=d1(位置,能量,粒子类型,向量 半径) SI1 -1 0.9 1 $ histogram for cosine bin limits余弦分布极限的直方图 SP1 0 0.95 0.05 $ frac. solid angle for each bin SB1 0. 0. 1. $ source bias for each bin

对于这个圆锥体源,计算结果的归一化为在4π立体弧度内有一个源粒子存在。为了归一化结果为每个源这种圆锥体准直效果应该应用与优先在特定方向上偏置粒子的发射。SIN项是顶部箱体的余弦极限

粒子均在圆锥体内,需要在SDEF中加入WGT=fsa2,fsa2为圆锥体的部分立体角(上面的实例中为0.05)。

?i?cos?i的升序排列。第一项为-1。角度参照由VEC指定的方向。SPn项为此体元从?i?1到?i给出了部分

立体角fsai?[(1??i?1)?(1??i)]2,SBn项是给出了用户设定的体源中每个角度发射粒子的概率。注意,

开始概率必须是0,因为从(-∞,-1)是不切实际的。

3.3.5复杂体源

两个圆柱体源

c --- 2 volumetric sources uniformly distributed in cells 8 & 9.(两个体源均匀的分布在栅元8或是9中)

c Both sources emit-1.25 MeV photons. Surround both source cells by a large sampling cylinder defined by c the POS RAD and EXT parameters. The rejection technique is used to pick source points with cells 8 and 9 c with the specified frequency.(每个源均释放能量为1.25MeV的光子,围绕源的栅元是被广泛抽样的圆柱体, 由POS,RAD和EXT参数定义。这种舍选技术被用于使用指定的频率在栅元8和栅元9中选取点源) c

SDEF ERG=1.25 CEL d1 AXS=0 0 1 POS 0 0 0 RAD d2 EXT d5 ( 能量 栅元 向量 位置 半径 轴向范围 )

SI1 L 8 9 $ source cells: src 1 =cell 8, src 2 =cell 9(体源:编码1=栅元8;编码2=栅元9) SP1 0.8 0.2 $ 80% from src 1; 20% from src 2(80%来自1号源;20%来自2号源) SI2 0 50 $ radius of cyl. containing cells 8 & 9(1号包括栅元8和栅元9的圆柱体的半径) SI5 -30 30 $ axial range of cyl. containing src cells(包括编码栅元的圆柱体的轴向半径)

两个发射不同能量光子的圆柱体源

c --- Two spatially different cylindrical monoenergetic sources.(两个空间不同位置的圆柱体单能源) c The size and position of each cyl. source depends on the source energy (FERG). C(每个圆柱体体源的尺寸和位置取决于源的能量(FETG))

SDEF ERG=d1 POS=FERG d8 AXS=0 0 1 RAD=FERG d2 EXT=FERG d5 C( 能量 位置(能量函数) 向量 半径(能量函数) 轴向范围(能量函数))

c -- set source energies: .667 MeV for region 1 and 1.25 MeV for region 2(设置能量为:区域1为0.667MeV;区域2为1.25MeV)

SI1 L 0.667 1.25 $ fix energies: .667 MeV for region 1 and 1.25 MeV for region 2 SP1 0.4 0.6 $ 20% from src 1(Cs-137); 80% from src 2 (Co-60) c -- set positions of the 2 source cylinders(设置2号圆柱体源的位置)

DS8 S 9 10 $ based on source chosen, get position(依据源,确定其位置) SI9 L -30 0 0 $ center for spatially sampling of source 1(源1的空间抽样中心位置) SP9 1 $ prob. distn for src 1 center(1号源中心概率)

SI10 L 30 0 0 $ center for spatially sampling of source 2(源2的空间抽样中心位置) SP10 1 $ prob. distn for src 2 center(2号源中心概率)

c -- set radius and axial limits for each source cyclinder(设置每个源的半径和轴向极限) DS2 S 3 4 $ distn for sampling radially from each src axis() SI3 0 20 $ radial sampling limits for src1(1号源抽样半径)

SP3 -21 1 $ radial sampling weight for src1 r^1(1号源半径抽样权重为R^1) SI4 0 10 $ radial sampling limits for src2(2号源半径抽样半径)

SP4 -21 1 $ radial sampling weight for src2 r^1(2号源半径抽样权重为R^1) DS5 S 6 7 $ distns for sampling axially for each src()

SI6 -10 10 $ axial sampling limits for src1(1号源轴向抽样极限)

SP6 -21 0 $ axial sampling weight for src1 r^0(1号源轴向抽样权重为R^0) SI7 -30 30 $ axial sampling limits for src2(2号源抽样极限)

SP7 -21 0 $ axial sampling weight for src2 r^0(2号源轴向抽样权重为R^0)

两个发射不同能量光子的任意体源

c --- 2 volumetric monoenergetic sources in complex-shaped cells 8 & 9 (在复杂形状栅元8和9中的两个单能体源)

c Spatial sampling uses the rejection technique by placing a finite cylinder over each source cell. A random c point inside a cylinder is accepted as a source point only if it is inside the source cell. Location and size of c the sampling cylinders and source photon energies are functions of the source cells (FCEL).

C空间抽样采用舍选法,此法通过在每个栅元圆周围设置有限圆柱体。在圆柱体中任意一点,只有位于源栅元中的点才被当做源点。抽样圆柱体的尺寸、位置和光子源的能量是源栅元的函数(FCEL).

SDEF CEL=d1 POS=FCEL d2 AXS=0 0 1 RAD=FCEL d5 EXT=FCEL d8 ERG=FCEL d20 C( 栅元 位置(栅元函数) 向量 半径(栅元函数) 轴向范围(栅元函数) 能量(栅元函数)) SI1 L 8 9 $ choose which cell source region to use for source(选择栅元用作源) SP1 0.4 0.6 $ 40% from src 1; 60% from src 2(40%来自1号源;60%来自2号源) c -- set POS for each source(设置每个源的位置)

DS2 S 3 4 $ based on the cell chosen, set distribution for POS(依赖源的选择,设置位置分布) SI3 L -30 0 0 $ center for spatially sampling of source 1(1号源空间抽样中心) SP3 1 $ prob. distn for src 1 center

SI4 L 30 0 0 $ center for spatially sampling of source 2(2号源空间抽样中心) SP4 1 $ prob. distn for src 2 center

c -- set RAD for each source (must completely include cells 8 or 9) (设置每个源的半径(必须完全包括)栅元8和9)

DS5 S 6 7 $ distns for sampling radially from each src axis SI6 0 20 $ radial sampling limits for src1(1号源半径抽样极限) SP6 -21 1 $ radial sampling weight for src1(1号源半径抽样权重) SI7 0 10 $ radial sampling limits for src2(2号源半径抽样权重) SP7 -21 1 $ radial sampling weight for src2(2号源半径抽样权重) c -- set EXT for each source (must completely include cells 8 or 9) (设置每个源的轴向范围(必须完全包含栅元8和9)) DS8 S 9 10 $ distns for sampling axially for each src

SI9 -10 10 $ axial sampling limits for src1(1号源轴向抽样极限) SP9 -21 0 $ axial sampling weight for src1(1号源轴向抽样权重) SI10 -30 30 $ axial sampling limits for src2(2号源轴向抽样极限)