Figure 5. The tested samples are removed from the chamber and put on a glass plate

图5 将被试验的样品从试验区移出放置在玻璃器皿中。

Figure 6. The tested samples are put into the oven for drying at 80?C for 60 minutes.

图6 被试验的样品放入烘箱80度烘烤60分钟。

2. ANALYSIS OF TESTED SAMPLES 样品分析

The dryed and cooled samples are analyzed using optical (stereo microscope/metallurgical microscope) microscopes or scanning electron microscope (SEM). Images of the tested connector springs are imaged and the images are saved. These images are compared with respective gauge and are given a score according to the gauge scale.

风干/冷却后的样品使用光学显微镜或扫描电子显微镜进行分析。这些图像选用不同测量仪进行对比及记录。

2.1 Optical gauge 光学测量仪

This optical gauge is imaged with a Hirox KH-3000 stereo microscope. 这个光学测量仪与Hirox KH-3000立体显微镜很相似。

0 图7 光学测量仪0-2

1 2 Figure 7. Optical gauge with scores 0, 1 and 2.

0 1 2 3

Figure 8. Old optical gauge with scores 0-5. 图8 老的光学测量仪0-5

2.2 Scanning Electron Microscope (SEM) gauge 扫描电子显微镜 测量 3.2 扫描电子显微镜

This SEM gauge is imaged with a FEI-FEG ESEM Electron Scanning Microscope in LowVac Mode.

扫描电子显微镜与FEI-FEG ESEM的电子扫描显微镜极为相似.

0 图九 SEM下的图0-2

1 2 Figure 9. SEM gauge with scores 0, 1 and 2.

0 1 2

Figure 10. Old SEM gauge with scores 0-5. 图10 老式SEM下的图0-5

2.3 Requirements and acceptance criteria 要求和接收标准

2.3.1 Requirements要求

Minimum sample amount is 6 connectors. The plating strips of contacts can also be used and the minimum amount of contacts is 6 times the number of pins per connector. All samples should be tested at same time.

最少的样品量为6个连接器。电镀条片的接触，也可用于及最低数额的接触是6倍的数量每引脚连接器。所有样品应在同一时间进行检验。

The examination and records are applied to the critical area of individual contact. The definition of critical area of contacts is decribed in Appendix I.

检查和记录，是适用于临界区域的个别接触。定义中的关键领域进行接触，是描述在附录一。

Recommandation for the magnifications used for optical microscope observation is described in Appendix II.

建议使用倍率光学显微镜进行检验，见附录二描述。 2.3.2 Acceptance criteria 验收标准

The score for the tested sample is got by comparing the microscope image of the tested sample with the gauge, Figure 7-Figure 10.

通过不同的显微镜进行样品对比，得出不同的测试结果。图7 -图10 。

More information for the criteria is described in Appendix III. 关于标准的更多信息见描述。

Table 1. Score, Result and Actions

Score 0 1 Result Accepted 接受 整改后接受 Actions - Nokia which includes:整改计划包括下面几方面，由供应商制作完成后送交NOKIA。 ? ? Actions for root cause analysis原因分析 Time schedule时间表 Accepted with actions Action plan needs to be created by supplier and sent to Correction needs to be implemented according root cause analysis 根据原因分析执行整改措施 Improved samples need to be delivered to Nokia for testing and analysing.改进后的样品送交NOKIA作测试及分析。 2 Rejected 不合格 Nokia may issue a hold on further delivery or request a statistic analysis Action plan needs to be created by supplier and sent to Nokia which includes: 整改计划包括下面几方面，由供应商制作完成后送交NOKIA。 ? ? Actions for root cause analysis原因分析 Time schedule 时间表 Correction needs to be implemented according root cause analysis根据原因分析执行整改措施 Improved samples need to be delivered to Nokia for testing and analysing. 改进后的样品送交NOKIA作测试及分析。

2.3.3 Result evaluation

Observation/examination need to be carried out for all contacts under the test. The scores for all contacts under test should be recorded in the report. 试验中所以接触点都要做检查及测试，并记录测试结果。

Depending on the test results, a statistic analysis may be requested. 应根据检查结果做出统计分析。

The requirements and procedures for statistic analysis are documented separately. 与统计分析相关的证明报告需单独列出来。