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Figure 5. The tested samples are removed from the chamber and put on a glass plate

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Figure 6. The tested samples are put into the oven for drying at 80?C for 60 minutes.

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2. ANALYSIS OF TESTED SAMPLES ÑùÆ··ÖÎö

The dryed and cooled samples are analyzed using optical (stereo microscope/metallurgical microscope) microscopes or scanning electron microscope (SEM). Images of the tested connector springs are imaged and the images are saved. These images are compared with respective gauge and are given a score according to the gauge scale.

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2.1 Optical gauge ¹âѧ²âÁ¿ÒÇ

This optical gauge is imaged with a Hirox KH-3000 stereo microscope. Õâ¸ö¹âѧ²âÁ¿ÒÇÓëHirox KH-3000Á¢ÌåÏÔ΢¾µºÜÏàËÆ¡£

0 ͼ7 ¹âѧ²âÁ¿ÒÇ0-2

1 2 Figure 7. Optical gauge with scores 0, 1 and 2.

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Figure 8. Old optical gauge with scores 0-5. ͼ8 ÀϵĹâѧ²âÁ¿ÒÇ0-5

2.2 Scanning Electron Microscope (SEM) gauge ɨÃèµç×ÓÏÔ΢¾µ ²âÁ¿ 3.2 ɨÃèµç×ÓÏÔ΢¾µ

This SEM gauge is imaged with a FEI-FEG ESEM Electron Scanning Microscope in LowVac Mode.

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1 2 Figure 9. SEM gauge with scores 0, 1 and 2.

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Figure 10. Old SEM gauge with scores 0-5. ͼ10 ÀÏʽSEMϵÄͼ0-5

2.3 Requirements and acceptance criteria ÒªÇóºÍ½ÓÊÕ±ê×¼

2.3.1 Requirements񻂗

Minimum sample amount is 6 connectors. The plating strips of contacts can also be used and the minimum amount of contacts is 6 times the number of pins per connector. All samples should be tested at same time.

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The examination and records are applied to the critical area of individual contact. The definition of critical area of contacts is decribed in Appendix I.

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Recommandation for the magnifications used for optical microscope observation is described in Appendix II.

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The score for the tested sample is got by comparing the microscope image of the tested sample with the gauge, Figure 7-Figure 10.

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More information for the criteria is described in Appendix III. ¹ØÓÚ±ê×¼µÄ¸ü¶àÐÅÏ¢¼ûÃèÊö¡£

Table 1. Score, Result and Actions

Score 0 1 Result Accepted ½ÓÊÜ Õû¸Äºó½ÓÊÜ Actions - Nokia which includes:Õû¸Ä¼Æ»®°üÀ¨ÏÂÃæ¼¸·½Ã棬Óɹ©Ó¦ÉÌÖÆ×÷Íê³ÉºóËͽ»NOKIA¡£ ? ? Actions for root cause analysisÔ­Òò·ÖÎö Time scheduleʱ¼ä±í Accepted with actions Action plan needs to be created by supplier and sent to Correction needs to be implemented according root cause analysis ¸ù¾ÝÔ­Òò·ÖÎöÖ´ÐÐÕû¸Ä´ëÊ© Improved samples need to be delivered to Nokia for testing and analysing.¸Ä½øºóµÄÑùÆ·Ëͽ»NOKIA×÷²âÊÔ¼°·ÖÎö¡£ 2 Rejected ²»ºÏ¸ñ Nokia may issue a hold on further delivery or request a statistic analysis Action plan needs to be created by supplier and sent to Nokia which includes: Õû¸Ä¼Æ»®°üÀ¨ÏÂÃæ¼¸·½Ã棬Óɹ©Ó¦ÉÌÖÆ×÷Íê³ÉºóËͽ»NOKIA¡£ ? ? Actions for root cause analysisÔ­Òò·ÖÎö Time schedule ʱ¼ä±í Correction needs to be implemented according root cause analysis¸ù¾ÝÔ­Òò·ÖÎöÖ´ÐÐÕû¸Ä´ëÊ© Improved samples need to be delivered to Nokia for testing and analysing. ¸Ä½øºóµÄÑùÆ·Ëͽ»NOKIA×÷²âÊÔ¼°·ÖÎö¡£

2.3.3 Result evaluation

Observation/examination need to be carried out for all contacts under the test. The scores for all contacts under test should be recorded in the report. ÊÔÑéÖÐËùÒÔ½Ó´¥µã¶¼Òª×ö¼ì²é¼°²âÊÔ£¬²¢¼Ç¼²âÊÔ½á¹û¡£

Depending on the test results, a statistic analysis may be requested. Ó¦¸ù¾Ý¼ì²é½á¹û×ö³öͳ¼Æ·ÖÎö¡£

The requirements and procedures for statistic analysis are documented separately. Óëͳ¼Æ·ÖÎöÏà¹ØµÄÖ¤Ã÷±¨¸æÐèµ¥¶ÀÁгöÀ´¡£